ContGB-G Datasheet
AFM Probe Type: ContGB-G
Product Description:
Rotated, monolithic silicon AFM probe for contact mode and special applications;
Symmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).
Symmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).
- Not recommend for applications with abrasive sample surfaces in Electrical Measurements.
Consistent high quality at a lower price!
This product features alignment grooves on the backside of the holder chip.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 450 µm(440 - 460 µm)* | 50 µm(45 - 55 µm)* | 2 µm(1 - 3 µm)* | 0.2 N/m(0.07 - 0.4 N/m)* | 13 kHz(9 - 17 kHz)* |
AFM Tips:
| Shape | Tip Height | Tip Set Back | Tip Radius | Half Cone Angles |
|---|---|---|---|---|
| Rotated | 17 µm(15 - 19 µm)* | 15 µm(10 - 20 µm)* | <25 nm | 20°-25° along cantilever axis 25°-30° from side 10° at the apex |
* typical range
Coating:
Overall gold coating, 70 nm thickSensors Datasheets:
No datasheet
Purchasing Info:
Product Availability: |
From stock. |
Price Description: |
No taxes applied except 6% in South Carolina. |
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