NANOSENSORS™ DT-CONTR probes are designed for contact mode (repulsive mode) AFM imaging. The CONT type is optimized for high sensitivity due to a low force constant.
For applications that require hard contact between tip and sample this SPM probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.
The probe offers unique features:
- real diamond coating
- high mechanical Q-factor for high sensitivity
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 450 µm (440 - 460 µm)* | 50 µm (42.5 - 57.5 µm)* | 2 µm (1 - 3 µm)* | 0.5 N/m (0.1 - 1.7 N/m)* | 20 kHz (11 - 29 kHz)* | ||
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Standard | 0 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* | < 100 nm (< 200 nm guaranteed) |
* guaranteed range
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