Product Description:

NanoWorld Pointprobe® EFM probes are designed for electrostatic force microscopy. The force constant and the special coating of the EFM type are optimised for this type of application. This type of probe yields a very high force sensitivity, while simultaneously enabling tapping^™ and lift mode operation. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Application Modes:

• AFM Probes for Electrostatic Force Microscopy (EFM) / Electrical AFM Measurements (Tuna, SSR, SCM)

AFM Probe Specifications:

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	beam	225 µm (220 - 230 µm)*	28 µm (22.5 - 32.5 µm)*	3 µm (2.5 - 3.5 µm)*	2.8 N/m (1.2 - 5.5 N/m)*	75 kHz (60 - 90 kHz)*

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
	Standard	0 µm (10 - 15 µm)*	10 - 15 µm*	0 µm (0 - 0 µm)*	< 25 nm

* typical range

Coating:

The platinum iridium5 (PtIr5) coating on both sides of the probe allows electrical contacts between tip and sample (high conductivity) while enhancing the reflectivity of the cantilever. The typical tip radius of curvature is less than 25 nm.

Probes Datasheets:

Datasheet for all probes with sets of 10 or 20 probes.
Datasheet for up to 32 probes with full wafer.