NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.
All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
Additionally this probe offers excellent tip radius of curvature.
This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Veeco Instruments Inc. is no longer selling this probe which has always been manufactured by NanoWorld®.
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 450 µm (445 - 455 µm)* | 50 µm (45 - 55 µm)* | 2 µm (1.5 - 2.5 µm)* | 0.2 N/m (0.07 - 0.4 N/m)* | 13 kHz (9 - 17 kHz)* | ||
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Standard | 0 µm (10 - 15 µm)* | 10 - 15 µm* | 0 µm (0 - 0 µm)* | < 8 nm (< 12 nm guaranteed) |
* typical range
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