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Product Description:

Rotated, monolithic silicon AFM probe with symmetric tip shape, for contact mode and electric modes like:
- Scanning Capacitance Microscopy (SCM),
- Electrostatic Force Microscopy (EFM),
- Kelvin probe Force Microscopy (KFM),
- Scanning probe lithography;

The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).

Consistent high quality at a lower price!

This product features alignment grooves on the back side of the holder chip.

Application Modes:

• AFM Probes for Electrostatic Force Microscopy (EFM) / Electrical AFM Measurements (Tuna, SSR, SCM)

AFM Probe Specifications:

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	beam	450 µm (440 - 460 µm)*	50 µm (45 - 55 µm)*	2 µm (1 - 3 µm)*	0.2 N/m (0.07 - 0.4 N/m)*	13 kHz (9 - 17 kHz)*

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
	Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm (10 - 20 µm)*	< 25 nm		20°-25° along cantilever axis  25°-30° from side  10° at the apex

* typical range

Coating:

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.