AFM Probe Type: ElectriMulti75-G

Product Description:

Rotated, monolithic silicon AFM probe with symmetric tip shape, designed for force modulation, pulsed force mode (PFM) and electric modes like:
- Scanning Capacitance Microscopy (SCM),
- Electrostatic Force Microscopy (EFM),
- Kelvin probe Force Microscopy (KFM),
- Scanning probe lithography;

The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs). Consistent high quality at a lower price!

Application Modes:

• AFM Probes for Electrostatic Force Microscopy (EFM) / Electrical AFM Measurements (Tuna, SSR, SCM)