AFM Probes » NCST

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Order Code Price
NCST-10 Probes per set 10 pcs
Volume Discount Available
NCST-20 Probes per set 20 pcs
NCST-50 Probes per set 50 pcs
$1 104.00
NCST-380 Probes per set 380 pcs
$5 672.00


Soft Tapping Mode AFM Probe

Coating: None
Tip shape: Standard
F 160 kHz
C 7.4 N/m
L 150 µm
*nominal values

NanoWorld Pointprobe® NCST AFM probes are designed for non-contact or soft tapping™ mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. Thus, tip and sample wear could be significantly decreased.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this AFM probe offers an excellent tip radius of curvature.


AFM Tip:

  • AFM Cantilever:

  • Beam
  • 150 µm (145 - 155 µm)*
  • 27 µm (22 - 32 µm)*
  • 2.8 µm (2.3 - 3.3 µm)*
  • 7.4 N/m (3 - 16 N/m)*
  • 160 kHz (120 - 205 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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