NanoWorld Pointprobe® NCST AFM probes are designed for non-contact or soft tapping™ mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. Thus, tip and sample wear could be significantly decreased.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid. Additionally this AFM probe offers an excellent tip radius of curvature.
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 150 µm (145 - 155 µm)* | 27 µm (22 - 32 µm)* | 2.8 µm (2.3 - 3.3 µm)* | 7.4 N/m (3 - 16 N/m)* | 160 kHz (120 - 205 kHz)* | ||
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Standard | 12.5 µm (10 - 15 µm)* | 10 - 15 µm* | 0 µm (0 - 0 µm)* | < 8 nm (< 12 nm guaranteed) |
* typical range
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