NanoWorld Pointprobe® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping™ mode imaging is possible with this AFM probe. All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
For applications that require hard contact between tip and sample this probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond.
The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.
The CDT features a conductive diamond coating. Some typical applications for this tip are Scanning Spreading Resistance Microscopy (SSRM), Tunneling AFM (Conducting AFM) and Scanning Capacitance Microscopy (SCM).
AFM Probe Specifications:
||tip set back
||full cone angle
||half cone angle
10 - 15
< 200 nm guaranteed
* typical range
The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.
Datasheet for all sensors with sets of 10 or 20 sensors.
Datasheet for up to 32 sensors with full wafer.