The new PointProbe®Plus (PPP) combines the well-known features of the proven PointProbe®series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
The NANOSENSORS™ PPP-CONTSCAuD is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
The probe offers unique features:
- excellent tip radius of curvature
- highly doped to dissipate static charge
- Au coating on detector side of cantilever
- chemically inert
- precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage of the
- compatible with PointProbe® Plus XY-Alignment Series
This product features alignment grooves on the back side of the holder chip.
Product screencast NANOSENSORS™ PointProbe® Plus AFM Probes
Please watch the new product screencast on NANOSENSORS™ PointProbe® Plus AFM Probes at http://youtu.be/watch?v=oo-NFxKOko8.
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AFM Probe Specifications:
||Tip Set Back
||Full Cone Angle
||Half Cone Angle
< 7 nm
* Guaranteed range
A metallic layer (gold) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.
Datasheet for all AFM probes with sets of 10 or 20 probes