The NANOSENSORS™ PPP-CONTSCPt is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
The probe offers unique features:
- metallic conductivity of the tip
- high mechanical Q-factor for high sensitivity
- precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage of the
alignment chip
- compatible with PointProbe® Plus XY-Alignment Series
Please note: Wear at the tip can occur if operating in contact-, friction- or force modulation mode.
This product features alignment grooves on the backside of the holder chip.
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 225 µm (215 - 235 µm)* | 48 µm (40 - 55 µm)* | 1 µm (0.1 - 2 µm)* | 0.2 N/m (0.01 - 1.87 N/m)* | 23 kHz (1 - 57 kHz)* | ||
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Standard | 0 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* |
* guaranteed range
On stock
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