AFM Probe Type: PPP-EFM

Product Description:

The new PointProbe®Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images.

The PPP-EFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the cantilever increasing the electrical conductivity of the tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.

 
    The probe offers unique features:
        - metallic conductivity of the tip
        - high mechanical Q-factor for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
          of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series

    Please note:
        - Wear at the tip can occur if operating in contact-, friction- or force modulation mode.
        - Although this is possible, it is not recommended to use PtIr5 coated tips for electrical contacting
          in applications where it is necessary to conduct high current. The very thin layer of PtIr5
          is unable to support much current. 

This product features alignment grooves on the backside of the holder chip.

Application Modes:

• AFM Probes for Electrostatic Force Microscopy (EFM) / Electrical AFM Measurements (Tuna, SSR, SCM)