Product Description:

The NANOSENSORS™ PPP-LC-MFMR AFM probe is coated with a soft magnetic thin film enabling the measurement of magnetic domains in soft magnetic samples. Due to the low coercivity of the tip coating the magnetisation of the tip will easily get reoriented by hard magnetic samples.

The soft magnetic coating on the tip has a coercivity of app. 0.75 Oe and a remanence magnetization of app. 225 emu/cm³ (these values were determined on a flat surface).

    The SPM probe offers unique features:
        - soft magnetic coating on the tip side (coercivity of app. 0.75 Oe, remanence magnetization
          of app. 225 emu/cm3)
        - effective magnetic moment 0.75x of standard probes
        - excellent tip radius of curvature
        - magnetic resolution better than 35 nm
        - Al coating on detector side of cantilever enhancing the reflectivity of the laser beam
          by a factor of about 2.5
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
          of the alignment chip
        - compatible with PointProbe^® Plus XY-Alignment Series

This product features alignment grooves on the backside of the holder chip.

Application Modes:

• Magnetic Force Microscopy AFM Probes (MFM)