The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images.
NANOSENSORS™ PPP-NCHAu AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This sensor type combines high electrical conductivity with outstanding sensitivity and fast scanning ability.
The probe offers unique features:
- metallic conductivity of the tip
- Au coating on detector side of cantilever
- chemically inert
Please note: Wear at the tip can occur if operating in contact-, friction- or force modulation mode.
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 125 µm (115 - 135 µm)* | 30 µm (22.5 - 37.5 µm)* | 4 µm (3 - 5 µm)* | 42 N/m (10 - 130 N/m)* | 330 kHz (204 - 497 kHz)* | ||
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Standard | 0 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* |
* guaranteed range
On stock
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