Product Description:

The NANOSENSORS™ PPP-QLC-MFMR AFM probe combines the low disturbance of magnetic samples by a soft magnetic coating with the high mechanical quality factor under ultra high vacuum conditions of the Q30K-Plus-Series. Low coercivity and a Q-factor of more than 35,000 enable magnetic force microscopy of soft magnetic samples and high operation stability under UHV conditions. Due to the low coercivity of the tip coating the magnetisation of the tip will easily get reoriented by hard magnetic samples.
 

    The SPM probe offers unique features:
        - soft magnetic coating on the tip side (coercivity of app. 0.75 Oe, remanence magnetization
          of app. 225 emu/cm3)
        - effective magnetic moment 0.75x of standard probes
        - excellent tip radius of curvature
        - magnetic resolution better than 35 nm
        - Al coating on detector side of cantilever enhancing the reflectivity of the laser beam
          by a factor of about 2.5
        - excellent mechanical Q-factor under UHV conditions for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
          of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series


As both coatings are almost stress-free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.

This product features alignment grooves on the backside of the holder chip.

Application Modes:

• Magnetic Force Microscopy AFM Probes (MFM)