The new PointProbe® Plus Q30K-Plus combines the well-known features of the proven PointProbe® Plus series such as a further reduced and more reproducible tip radius as well as a more defined tip shape with a high mechanical quality factor (Q-factor) under ultra high vacuum (UHV) conditions. The typical Q-factor of over 35000 under UHV conditions and the aluminium coating on the detector side provide excellent resolution and an enhanced signal to noise ratio.
NANOSENSORS™ PPP-QNCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode) under UHV-conditions. Due to its high Q-factor and the typical features of the PPP series this AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
The probe offers unique features:
- excellent tip radius of curvature
- highly doped to dissipate static charge
- Al coating on detector side of cantilever
- chemically inert
- excellent mechanical Q-factor under UHV conditions for high sensitivity
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 125 µm (115 - 135 µm)* | 30 µm (22.5 - 37.5 µm)* | 4 µm (3 - 5 µm)* | 42 N/m (10 - 130 N/m)* | 330 kHz (204 - 497 kHz)* | ||
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Standard | 0 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* | < 7 nm (< 10 nm guaranteed) |
* guaranteed range
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