AFM Probe Type: PPP-XYCONTR

Product Description:

The XY-auto-alignment probes for Contact mode application with a Reflex coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 450 µm long cantilevers optimized for contact mode applications. Probe exchange with a tip repositioning accuracy of better than ± 8µm is possible for all probes of the XY-alignment probes series – independent of their cantilever length. This series is adjusted to the tip position of probes with a cantilever length of 225µm.

As a matter of course, the features of the proven PointProbe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible tip radius as well as a precisely defined tip shape are maintained. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

    The probe offers unique features:
        - excellent tip radius of curvature
        - highly doped to dissipate static charge
        - Al coating on detector side of cantilever
        - chemically inert
        - high mechanical Q-factor for high sensitivity
        - tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)

Application Modes:

• Contact Mode AFM Probes