PPP-ZEILR datasheet
AFM Probe Type: PPP-ZEILR
Product Description:
The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
For owners of a Zeiss Veritekt or Seiko Instruments microscope using contact mode we recommend NANOSENSORS™ PPP-ZEILR (Zeiss Veritekt / low force constant). Compared to the contact mode AFM probe (CONT) the force constant is slightly increased.
The probe offers unique features:
- excellent tip radius of curvature
- highly doped to dissipate static charge
- Al coating on detector side of cantilever
- high mechanical Q-factor for high sensitivity
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| 1 | 450 µm(440 - 460 µm)* | 55 µm(47.5 - 62.5 µm)* | 4 µm(3 - 5 µm)* | 1.6 N/m(0.6 - 3.9 N/m)* | 27 kHz(19 - 35 kHz)* |
AFM Tips:
| on Cant. | Shape | Tip Radius |
|---|---|---|
| 1 | Standard | <7 nm( < 10 nm guaranteed ) |
* - guaranteed range
Coating:
The reflex coating is an approximately 30 nm thick aluminium coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stres-free coating is bending the cantilever less than 2% of the cantilever length.
Sensors Datasheets:
Datasheet for all AFM probes with sets of 10 or 20 probes.
Datasheet for up to 32 probes with full wafer.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
No taxes applied except 5% in South Carolina. |
