Product Description:

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For owners of a Zeiss Veritekt or Seiko Instruments microscope using contact mode we recommend NANOSENSORS™ PPP-ZEILR (Zeiss Veritekt / low force constant). Compared to the contact mode AFM probe (CONT) the force constant is slightly increased.

    The probe offers unique features:
        - excellent tip radius of curvature
        - highly doped to dissipate static charge
        - Al coating on detector side of cantilever
        - high mechanical Q-factor for high sensitivity

Application Modes:

AFM Probe Specifications:

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
	Standard	0 µm	0 - 0 µm*	0 µm (0 - 0 µm)*	< 7 nm (< 10 nm guaranteed)

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	beam	450 µm (440 - 460 µm)*	55 µm (47.5 - 62.5 µm)*	4 µm (3 - 5 µm)*	1.6 N/m (0.6 - 3.9 N/m)*	27 kHz (19 - 35 kHz)*

* guaranteed range

Coating:

The reflex coating is an approximately 30 nm thick aluminium coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stres-free coating is bending the cantilever less than 2% of the cantilever length.