AFM Probes » PPP-ZEILRR

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For owners of a Zeiss Veritekt or Seiko Instruments microscope using contact mode we recommend NANOSENSORS™ PPP-ZEILR (Zeiss Veritekt / low force constant). Compared to the contact mode AFM probe (CONT) the force constant is slightly increased.

The probe offers unique features:
    - excellent tip radius of curvature
    - highly doped to dissipate static charge
    - Al coating on detector side of cantilever
    - high mechanical Q-factor for high sensitivity
The reflex coating is an approximately 30 nm thick aluminium coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stres-free coating is bending the cantilever less than 2% of the cantilever length.

AFM Tip:

  • Standard
  • 10 - 15 µm
  • 7 nm
  • AFM Cantilever:

  • Beam
  • 450 µm (440 - 460 µm)*
  • 55 µm (47.5 - 62.5 µm)*
  • 4 µm (3 - 5 µm)*
  • 1.6 N/m (0.6 - 3.9 N/m)*
  • 27 kHz (19 - 35 kHz)*
  • ** guaranteed range range

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