AFM Probes » Q-EFM

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Q-EFM-10 Box of 10 AFM Probes
$375.00

Q-EFM

Premounted Electrical, Force Modulation AFM Probe, for Quesant/Ambios AFM systems

Coating: Electrically Conductive
Tip shape: Rotated
Cantilever:
F 75 kHz
C 3 N/m
L 225 µm
*nominal values

Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as:

  • scanning capacitance microscopy (SCM)
  • electrostatic force microscopy (EFM)
  • Kelvin probe force microscopy (KFM)
  • scanning probe lithography

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

Consistent high quality at a lower price!

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors ElectriMulti75-G AFM probe.

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 225 µm (215 - 235 µm)*
  • 28 µm (23 - 33 µm)*
  • 3 µm (2 - 4 µm)*
  • 3 N/m (1 - 7 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • * typical range

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