AFM Probes » Q-EFM

 Order  Request a quote (RFQ)
Order Code Price
Quantity
Q-EFM-10 Probes per set 10 pcs
$375.00

Q-EFM Premounted Electrical, Force Modulation AFM Probe, for Quesant/Ambios AFM systems

Coating: Chromium/Platinum Overall
Tip shape: Rotated
Cantilever:*
F 75 kHz
C 3 N/m
L 225 µm
*nominal values

Rotated, monolithic silicon AFM probe with symmetric tip shape, designed for electric modes such as:

  • scanning capacitance microscopy (SCM)
  • electrostatic force microscopy (EFM)
  • Kelvin probe force microscopy (KFM)
  • scanning probe lithography
Consistent high quality at a lower price!

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors ElectriMulti75-G AFM probe.

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Tip:

  • Rotated
  • 17 µm (15 - 19 µm)*
  • 15 µm (10 - 20 µm)*
  • 10 nm
  • 20°-25° front view 25°-30° from side 10° at the apex
  • AFM Cantilever:

  • Beam
  • 225 µm (215 - 235 µm)*
  • 28 µm (23 - 33 µm)*
  • 3 µm (2 - 4 µm)*
  • 3 N/m (1 - 7 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • ** typical range range

    Give us your feedback

    Did we miss any relevant information of this product?
    Did you find this or a comparable product for a better price?