Product Description:

Premounted on a T-Plate for Quesant AFM systems.

Rotated, monolithic silicon AFM probe with symmetric tip shape, designed for non-contact high frequency applications (intermittent contact, tapping in air) and electric modes like:
- Scanning Capacitance Microscopy (SCM),
- Electrostatic Force Microscopy (EFM),
- Kelvin probe Force Microscopy (KFM),
- Scanning probe lithography;

Consistent high quality at a lower price!

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors ElectriMulti75 AFM probe.

Application Modes:

• Premounted AFM Probes

AFM Probe Specifications:

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	beam	225 µm (215 - 235 µm)*	28 µm (23 - 33 µm)*	3 µm (2 - 4 µm)*	3 N/m (1 - 7 N/m)*	75 kHz (60 - 90 kHz)*

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
	Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm (10 - 20 µm)*	< 10 nm		20°-25° along cantilever axis 25°-30° from side 10° at the apex

* typical range

Coating:

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.