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Q-MFM Specification Sheet
AFM Probe Type: Q-MFMPremounted on a T-Plate for Quesant AFM systems
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Product Description:
Silicon based beam deflection cantilever for Magnetic Force Microscopy with magnetic coating on tip side and aluminium coating on detector side of the cantilever.
Tip radius below 60 nm.
Consistent high quality at a lower price!
This AFM probe features alignment grooves on the back side of the holder chip.
Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors Multi75M-G AFM probe.
Application Modes:
AFM Probe Specifications:
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 225 µm (215 - 235 µm)* | 28 µm (23 - 33 µm)* | 3 µm (2 - 4 µm)* | 3 N/m (1 - 7 N/m)* | 75 kHz (60 - 90 kHz)* | ||
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Rotated | 17 µm (15 - 19 µm)* | 15 - 19 µm* | 15 µm (10 - 20 µm)* | < 60 nm |
20°-25° along cantilever axis |
* typical range
Coating:
Hard magnetic, medium momentum coating on tip side and aluminium reflex coating on detector side of the cantileverPurchasing Information
Product Availability:
Available on demand. Please contact us for availability!
Price Description:
No taxes applied except 6% in South Carolina.
Does not include shipment costs.Terms & Conditions:
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Order:
| Order Code | Probes per Set | price, USD | Quantity |
|---|---|---|---|
| Q-MFM-10 | 10 pcs | 375.00 |
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