Q-MFM datasheet
AFM Probe Type:
Q-MFM
Premounted on a T-Plate for Quesant AFM systems
Product Description:
Silicon based beam deflection cantilever for Magnetic Force Microscopy with magnetic coating on tip side and aluminium coating on detector side of the cantilever.
Tip radius below 60 nm.
Consistent high quality at a lower price!
This AFM probe features alignment grooves on the back side of the holder chip.
Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors Multi75M-G AFM probe.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| 1 | 225 µm(215 - 235 µm)* | 28 µm(23 - 33 µm)* | 3 µm(2 - 4 µm)* | 3 N/m(1 - 7 N/m)* | 75 kHz(60 - 90 kHz)* |
AFM Tips:
| on Cant. | Shape | Tip Height | Tip Set Back | Tip Radius | Half Cone Angles |
|---|---|---|---|---|---|
| 1 | Rotated | 17 µm(15 - 19 µm)* | 15 nm(10 - 20 nm)* | <60 nm | 20°-25° along cantilever axis 25°-30° from side 10° at the apex |
Coating:
Hard magnetic, medium momentum coating on tip sideand aluminium reflex coating on detector side of the cantilever
Sensors Datasheets:
No datasheet
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
No taxes applied except 5% in South Carolina. |
