This competitively priced silicon nitride AFM probe features:
- 4 silicon nitride cantilevers for soft contact mode with two different lengths and force constants, mounted on standard silicon support chip;
- silicon nitride wedge tip
- overall tip height is 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm.
- Macroscopic half cone angle is 35°.
Consistent high quality at a lower price!
Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors SiNi AFM probe.
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| 1 | triangular | 200 µm (190 - 210 µm)* | 30 µm (25 - 35 µm)* | 520 µm (470 - 570 µm)* | 0.06 N/m | 10 kHz | |
| 2 | triangular | 100 µm (90 - 110 µm)* | 16 µm (11 - 21 µm)* | 520 µm (470 - 570 µm)* | 0.27 N/m | 30 kHz | |
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| 1 | Pyramid | 12 µm (10 - 14 µm)* | 10 - 14 µm* | 0 (0 - 0 )* | < 15 nm | 35° (macroscopic) | |
| 2 | Pyramid | 12 µm (10 - 14 µm)* | 10 - 14 µm* | 0 (0 - 0 )* | < 15 µm | 35° (macroscopic) |
* typical range
Available on demand. Please contact us for availability!
No taxes applied except 6% in South Carolina.
Does not include shipment costs.