Product Description:

This competitively priced silicon nitride AFM probe features:
- 4 silicon nitride cantilevers for soft contact mode with two different lengths and force constants, mounted on standard silicon support chip;
- silicon nitride wedge tip
- overall tip height is 12 μm (effective > 450 nm) with a double tip spacing of 450 μm.
- Macroscopic half cone angle is 35°.

Consistent high quality at a lower price!


Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors SiNi AFM probe.

Application Modes:

• Premounted AFM Probes

AFM Probe Specifications:

  AFM Cantilevers:

Cant.	Shape	Length	Width	Thickness	Force Const.	Res. Freq.
1	beam	100 µm(90 - 110 µm)*	16 µm(11 - 21 µm)*	520 µm(470 - 570 µm)*	0.27 N/m	30 kHz
2	beam	200 µm(190 - 210 µm)*	30 µm(25 - 35 µm)*	520 µm(470 - 570 µm)*	0.06 N/m	10 kHz

  AFM Tips:

on Cant.	Shape	Tip Height	Tip Radius	Half Cone Angles
1	Pyramid	12 µm(10 - 14 µm)*	<15 nm	35° (macroscopic)
2	Pyramid	12 µm(10 - 14 µm)*	<15 nm	35° (macroscopic)

Coating:

Gold/Chromium on detector side of the cantilever, 70 nm thick

Sensors Datasheets:

No datasheet