S-MFMR datasheet
AFM Probe Type:
S-MFMR 
Product Description:
NanoWorld Pointprobe® S-MFMR AFM probes are designed for the measurement of magnetic domains in soft magnetic samples. Due to the low coercivity of the soft magnetic tip coating the magnetisation of the tip will easily get reoriented by hard magnetic samples.
All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. The tip is shaped like a polygon based pyramid.
Additionally this sensor offers unique features:
- soft magnetic coating on the tip side (coercivity of app. 0.75 Oe, remanence magnetization of
app. 225 emu/cm3)
- effective magnetic moment 0.75x of standard probes
- excellent tip radius of curvature
- magnetic resolution better than 35 nm
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| 1 | 225 µm(220 - 230 µm)* | 28 µm(22.5 - 32.5 µm)* | 3 µm(2.5 - 3.5 µm)* | 2.8 N/m(1.2 - 5.5 N/m)* | 75 kHz(60 - 90 kHz)* |
AFM Tips:
| on Cant. | Shape | Tip Height | Tip Radius |
|---|---|---|---|
| 1 | Standard | 10 - 15 µm* | <30 nm guaranteed |
* - typical range
Coating:
The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.Purchasing Info:
Product Availability: |
From stock |
Price Description: |
No taxes applied except 5% in South Carolina. |
