Product Description:

NANOSENSORS™ SSS-NCH AFM probes are designed for non-contact mode or tapping mode AFM.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

    The probe offers unique features:
        - excellent tip radius of curvature
        - typical aspect ratio at 200 nm from tip apex in the order of 4:1
        - monolithic material
        - highly doped to dissipate static charge
        - chemically inert
        - high mechanical Q-factor for high sensitivity

Application Modes:

• Enhanced Resolution Imaging AFM Tips (Super Sharp Silicon, SSS Tips)

AFM Probe Specifications:

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
	Supersharp	0	0 - 0 *	0 (0 - 0 )*	< 2 nm (< 5 nm guaranteed)		< 10° at 200 nm from apex

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	beam	125 µm (115 - 135 µm)*	30 µm (30 - 45 µm)*	4 µm (3 - 5 µm)*	42 N/m (10 - 130 N/m)*	330 kHz (204 - 497 kHz)*

* guaranteed range

Probes Datasheets:

Datasheet for all sensors with sets of 10 or 20 sensors.
Datasheet for up to 32 sensors with full wafer.