AFM Probe Type: SSS-QMFMR

Product Description:

The NANOSENSORS™ SSS-QMFMR AFM probe combines the high resolution performance of the SuperSharpSilicon™ magnetic force microscopy probe with the high mechanical quality factor under ultra high vacuum conditions of the Q30K-Plus-Series. An extremely small radius of the coated tip, a high aspect ratio at the last few hundred nanometers of the tip and a Q-factor of more than 35,000 facilitates outstanding lateral resolution in the magnetic force image and high operation stability under UHV conditions.

Due to the low magnetic moment of the tip the sensitivity to magnetic forces is decreased if compared to standard MFM probe but the disturbance of soft magnetic samples is also reduced.

    The SPM probe offers unique features:
        - hard magnetic coating on the tip side (coercivity of app. 125 Oe, remanence magnetization
          of app. 80 emu/cm3)
        - effective magnetic moment 0.25x of standard probes
        - metallic electrical conductivity
        - excellent tip radius of curvature
        - magnetic resolution better than 25 nm
        - Al coating on detector side of cantilever enhancing the reflectivity of the laser beam
          by a factor of about 2.5
        - excellent mechanical Q-factor under UHV conditions for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
          of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the backside of the holder chip.

Application Modes:

• Magnetic Force Microscopy AFM Probes (MFM)