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Product Description:

Rotated, monolithic silicon AFM probe for non-contact high frequency applications (intermittent contact, tapping in air);
Symmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).

Consistent high quality at a lower price!

This product features alignment grooves on the back side of the holder chip.

Application Modes:

• Non-Contact / Tapping Mode AFM Probes

AFM Probe Specifications:

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
	Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm (10 - 20 µm)*	< 10 nm		20°-25° along cantilever axis 25°-30° from side 10° at the apex

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	beam	125 µm (115 - 135 µm)*	30 µm (25 - 35 µm)*	4 µm (3 - 5 µm)*	40 N/m (20 - 75 N/m)*	300 kHz (200 - 400 kHz)*

* typical range

Coating:

Aluminium reflex coating on detector side of the cantilever, 30 nm thick