Product Description:

Rotated, monolithic silicon AFM probe for non-contact high frequency applications (intermittent contact, tapping in air);
Symmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs). Chipsize: 3.4 x 1.6 x 0.3 mm

Consistent high quality at a lower price!

Application Modes:

• Non-Contact / Tapping Mode AFM Probes

AFM Probe Specifications:

  AFM Cantilevers:

Cant.	Length	Width	Thickness	Force Const.	Res. Freq.
1	125 µm(115 - 135 µm)*	30 µm(25 - 35 µm)*	4 µm(3 - 5 µm)*	40 N/m(20 - 75 N/m)*	300 kHz(200 - 400 kHz)*

  AFM Tips:

on Cant.	Shape	Tip Height	Tip Set Back	Tip Radius	Half Cone Angles
1	Rotated	17 µm(15 - 19 µm)*	15 nm(10 - 20 nm)*	<10 nm	20°-25° along cantilever axis 25°-30° from side 10° at the apex

Coating:

Aluminium reflex coating on detector side of the cantilever, 30 nm thick

Sensors Datasheets:

No datasheet