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Tap300GB Specification Sheet
AFM Probe Type: Tap300GB
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Product Description:
Rotated, monolithic silicon AFM probe for non-contact high frequency applications (intermittent contact, tapping in air) and special applications;
Symmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).
- Not recommend for applications with abrasive sample surfaces in Electrical Measurements.
Consistent high quality at a lower price!
Application Modes:
AFM Probe Specifications:
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 125 µm (115 - 135 µm)* | 30 µm (25 - 35 µm)* | 4 µm (3 - 5 µm)* | 40 N/m (20 - 75 N/m)* | 300 kHz (200 - 400 kHz)* | ||
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Rotated | 17 µm (15 - 19 µm)* | 15 - 19 µm* | 15 µm (10 - 20 µm)* | < 25 nm |
20°-25° along cantilever axis |
* typical range
Coating:
Overall gold coating, 70 nm thickPurchasing Information
Product Availability:
On stock
Price Description:
No taxes applied except 6% in South Carolina.
Does not include shipment costs.Terms & Conditions:
Order:
| Order Code | Probes per Set | price, USD | Quantity |
|---|---|---|---|
| Tap300GB-10 | 10 pcs | 240.00 |
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| Tap300GB-50 | 50 pcs | 1000.00 |
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