DT-NCHR
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Diamond Coated Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 80 N/m
Res. freq.: 400 kHz
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NW-DT-NCHR
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Diamond Coated Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 80 N/m
Res. freq.: 400 kHz
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DT-NCLR
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Diamond Coated Tapping Mode AFM Probe with Long Cantilever
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 72 N/m
Res. freq.: 210 kHz
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NW-DT-NCLR
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Diamond Coated Tapping Mode AFM Probe with Long Cantilever
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 72 N/m
Res. freq.: 210 kHz
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DT-FMR
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Diamond Coated Force Modulation AFM Probe
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 6.2 N/m
Res. freq.: 105 kHz
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NW-DT-FMR
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Diamond Coated Force Modulation AFM Probe
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 6.2 N/m
Res. freq.: 105 kHz
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DT-CONTR
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Diamond Coated Contact Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 450 µm
Force const.: 0.5 N/m
Res. freq.: 20 kHz
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Tap300DLC
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Diamond-Like-Carbon Coated Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Rotated
- Cantilever:
Length: 125 µm
Force const.: 40 N/m
Res. freq.: 300 kHz
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Tap190DLC
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Diamond-Like-Carbon Coated Tapping Mode AFM Probe with Long Cantilever
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
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Tap150DLC
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Diamond-Like-Carbon Coated Soft Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Rotated
- Cantilever:
Length: 125 µm
Force const.: 5 N/m
Res. freq.: 150 kHz
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Multi75DLC
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Diamond-Like-Carbon Coated Force Modulation AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 3 N/m
Res. freq.: 75 kHz
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ContDLC
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Diamond-Like-Carbon Coated Contact Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Rotated
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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CDT-NCHR
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Diamond Coated, Conductive Tapping Mode AFM Probe
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 80 N/m
Res. freq.: 400 kHz
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CDTP-NCHR
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Diamond Coated, Conductive Tapping Mode AFM Probe
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 120 N/m
Res. freq.: 480 kHz
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NW-CDT-NCHR
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Diamond Coated, Conductive Tapping Mode AFM Probe
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 80 N/m
Res. freq.: 400 kHz
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DDESP
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Diamond Coated, Conductive Tapping Mode AFM Probe
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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CDT-NCLR
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Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 72 N/m
Res. freq.: 210 kHz
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NW-CDT-NCLR
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Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 72 N/m
Res. freq.: 210 kHz
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CDT-FMR
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Diamond Coated, Conductive Force Modulation AFM Probe
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 6.2 N/m
Res. freq.: 105 kHz
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NW-CDT-FMR
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Diamond Coated, Conductive Force Modulation AFM Probe
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 6.2 N/m
Res. freq.: 105 kHz
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DDESP-FM
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Diamond Coated, Conductive Force Modulation AFM Probe
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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CDT-CONTR
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Diamond Coated, Conductive Contact Mode AFM Probe
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- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 450 µm
Force const.: 0.5 N/m
Res. freq.: 20 kHz
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CP-NCH-BSG
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Colloidal probe, AFM cantilever with round tip like a ball.
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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CP-NCH-SiO
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Colloidal probe, AFM cantilever with round tip like a ball.
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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CP-NCH-PM
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Colloidal probe, AFM cantilever with round tip like a ball.
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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CP-NCH-PS
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Colloidal probe, AFM cantilever with round tip like a ball.
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- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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CP-NCH-Au
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Colloidal probe, AFM cantilever with round tip like a ball.
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- Coating:
Gold
- Tip Shape:
Sphere
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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AFM Probes
