SSE_NCHR_13
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SuperSharp, Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
Supersharp, EBD
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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MSS_NCHR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Supersharp, EBD
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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MC90-70_ArrowNCR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Cylindrical, Arrow , High-Aspect-Ratio
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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biotool_PNP-TR_10
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Soft Contact AFM Probe for Biological Applications
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
High-Aspect-Ratio, Cone Shaped, Supersharp, EBD
- Cantilever:
Length: 100 µm
Force const.: 0.32 N/m
Res. freq.: 67 kHz
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MSS_NCHR_13
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Supersharp, High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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B1_FMR
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Special Nanoindentation AFM probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Sphere, Standard, Rotated, EBD
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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CNT500_ArrowNCR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Arrow , EBD
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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CNT100_ArrowNCR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Arrow , High-Aspect-Ratio
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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B1_CONTR
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Special Nanoindentation AFM probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Standard, Sphere, Rotated
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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B150_CONTR
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Special Nanoindentation AFM probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Sphere, Standard, Rotated, EBD
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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B150_FMR
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Special Nanoindentation AFM probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Rotated, EBD, Sphere, Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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SSE_FMR_13
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SuperSharp, Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
Supersharp, EBD
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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MSS_FMR_3
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Standard Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Supersharp
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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MSS_FMR_13
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SuperSharp, Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Supersharp
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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B150_NCHR
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Special Nanoindentation AFM probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Standard, Rotated, EBD, Sphere
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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B2_NCHR
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Special Nanoindentation AFM probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Sphere, Standard, Rotated
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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CDR70-EBD
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Arrow , Cylindrical, EBD
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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B50_FMR
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Special Nanoindentation AFM probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Sphere, Standard, Rotated, EBD
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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CDR50-EBD
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Arrow , Cylindrical, EBD
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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CDR130-EBD
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Arrow , Cylindrical, EBD
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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B100_CONTR
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Special Nanoindentation AFM probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Sphere, Standard, Rotated, EBD
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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B100_NCHR
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Special Nanoindentation AFM probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Sphere, Standard, Rotated
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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B50_CONTR
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Special Nanoindentation AFM probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Sphere, Standard, Rotated, EBD
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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B50_NCHR
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Special Nanoindentation AFM probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Sphere, Standard, Rotated
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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B2_CONTR
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Special Nanoindentation AFM probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Sphere, Standard, Rotated, EBD
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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B2_FMR
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Special Nanoindentation AFM probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Sphere, Standard, Rotated, EBD
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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M1_NCH_13
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
High-Aspect-Ratio, EBD
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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B1_NCHR
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Special Nanoindentation AFM probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Sphere, Standard, Rotated
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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EBD2-100_NCH_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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B100_FMR
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Special Nanoindentation AFM probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Sphere, Standard, Rotated, EBD
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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EBD2-100_NCH_13
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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EBD2-100_NCHR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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M1-ESD_NCH_13
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Aluminium
- Tip Shape:
Cone Shaped
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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DT-CONTR
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Diamond Coated Contact Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 450 µm
Force const.: 0.5 N/m
Res. freq.: 20 kHz
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DT-FMR
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Diamond Coated Force Modulation AFM Probe
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 6.2 N/m
Res. freq.: 105 kHz
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DT-NCHR
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Diamond Coated Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 80 N/m
Res. freq.: 400 kHz
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DT-NCLR
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Diamond Coated Tapping Mode AFM Probe with Long Cantilever
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 72 N/m
Res. freq.: 210 kHz
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NW-DT-FMR
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Diamond Coated Force Modulation AFM Probe
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 6.2 N/m
Res. freq.: 105 kHz
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NW-DT-NCLR
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Diamond Coated Tapping Mode AFM Probe with Long Cantilever
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 72 N/m
Res. freq.: 210 kHz
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NW-DT-NCHR
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Diamond Coated Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 80 N/m
Res. freq.: 400 kHz
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ContDLC
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Diamond-Like-Carbon Coated Contact Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Rotated
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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Multi75DLC
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Diamond-Like-Carbon Coated Force Modulation AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 3 N/m
Res. freq.: 75 kHz
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Tap150DLC
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Diamond-Like-Carbon Coated Soft Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Rotated
- Cantilever:
Length: 125 µm
Force const.: 5 N/m
Res. freq.: 150 kHz
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Tap190DLC
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Diamond-Like-Carbon Coated Tapping Mode AFM Probe with Long Cantilever
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
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Tap300DLC
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Diamond-Like-Carbon Coated Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Rotated
- Cantilever:
Length: 125 µm
Force const.: 40 N/m
Res. freq.: 300 kHz
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MC90-70_ArrowNCR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
35
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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AFM Probes
