PPP-FM
|
Standard Force Modulation AFM Probe |
- Coating:
None
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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PPP-FMR
|
Standard Force Modulation AFM Probe |
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2 N/m
Res. freq.: 75 kHz
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FM
|
Standard Force Modulation AFM Probe |
- Coating:
None
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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|
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FESP
|
Standard Force Modulation AFM Probe |
- Coating:
None
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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FMR
|
Standard Force Modulation AFM Probe |
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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|
Multi75
|
Standard Force Modulation AFM Probe |
- Coating:
None
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 3 N/m
Res. freq.: 75 kHz
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Multi75Al
|
Standard Force Modulation AFM Probe |
- Coating:
Reflex Aluminium
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 3 N/m
Res. freq.: 75 kHz
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Multi75Al-G
|
Standard Force Modulation AFM Probe
|
- Coating:
Reflex Aluminium
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 3 N/m
Res. freq.: 75 kHz
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All-In-One
|
AFM probe with 4 different cantilevers for various applications
|
- Coating:
None
- Tip Shape:
Rotated
- Cantilevers:
Cantilever 1:
Length: 100 µm
Force const.: 40 N/m
Res. freq.: 350 kHz
Cantilever 2:
Length: 150 µm
Force const.: 7.4 N/m
Res. freq.: 150 kHz
Cantilever 3:
Length: 210 µm
Force const.: 2.7 N/m
Res. freq.: 80 kHz
Cantilever 4:
Length: 500 µm
Force const.: 0.2 N/m
Res. freq.: 15 kHz
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All-In-One-Al
|
AFM probe with 4 different cantilevers for various applications
|
- Coating:
Reflex Aluminium
- Tip Shape:
Rotated
- Cantilevers:
Cantilever 1:
Length: 0
Force const.: 0
Res. freq.: 0
Cantilever 2:
Length: 100 µm
Force const.: 40 N/m
Res. freq.: 350 kHz
Cantilever 3:
Length: 150 µm
Force const.: 7.4 N/m
Res. freq.: 150 kHz
Cantilever 4:
Length: 210 µm
Force const.: 2.7 N/m
Res. freq.: 80 kHz
Cantilever 5:
Length: 500 µm
Force const.: 0.2 N/m
Res. freq.: 15 kHz
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ATEC-FM
|
Force Modulation AFM Probe with REAL Tip Visibility |
- Coating:
None
- Tip Shape:
Visible
- Cantilever:
Length: 240 µm
Force const.: 2.8 N/m
Res. freq.: 85 kHz
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|
Arrow-FM
|
Force Modulation AFM Probe with Tip at the Very End of the Cantilever |
- Coating:
None
- Tip Shape:
Arrow
- Cantilever:
Length: 240 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
|
|
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ARROW-FMR
|
Force Modulation AFM Probe with Tip at the Very End of the Cantilever |
- Coating:
Reflex Aluminium
- Tip Shape:
Arrow
- Cantilever:
Length: 240 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
|
|
SSS-FM
|
SuperSharp, Force Modulation AFM Probe |
- Coating:
None
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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|
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SSS-FMR
|
SuperSharp, Force Modulation AFM Probe |
- Coating:
Reflex Aluminium
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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|
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PPP-QFMR
|
Force Modulation AFM Probe, for UHV Conditions |
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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|
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PPP-FMAuD
|
Gold Coated Force Modulation AFM Probe |
- Coating:
Reflex Gold
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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|
Multi75GD
|
Gold Coated Force Modulation AFM Probe |
- Coating:
Reflex Gold
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 3 N/m
Res. freq.: 75 kHz
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|
PPP-RT-FMR
|
Standard Force Modulation AFM Probe |
- Coating:
Reflex Aluminium
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
|
|
Multi75M-G
|
Hard Magnetic, Medium Momentum AFM Probe
|
- Coating:
Hard Magnetic, Medium Momentum
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 3 N/m
Res. freq.: 75 kHz
|
|
CNT-FM
|
Single/double wall Carbon Nanotube Probe for high resolution imaging in non-contact-/tapping mode (soft tapping)
|
- Coating:
None
- Tip Shape:
Supersharp, CNT
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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|
CP-FM-Au
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
Gold
- Tip Shape:
Sphere
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
|
|
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CP-FM-BSG
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
|
|
|
CP-FM-PM
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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|
|
CP-FM-PS
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
|
|
|
CP-FM-SiO
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
|
|
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Multi75GB-G
|
Gold Coated Force Modulation AFM Probe
|
- Coating:
Gold Overall
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 3 N/m
Res. freq.: 75 kHz
|
|
Tipless-All-In-One-Al
|
Tipless AFM probe with 4 different cantilevers for various applications
|
- Coating:
Reflex Aluminium
- Tip Shape:
Tipless
- Cantilevers:
Cantilever 1:
Length: 100 µm
Force const.: 40 N/m
Res. freq.: 350 kHz
Cantilever 2:
Length: 150 µm
Force const.: 7.4 N/m
Res. freq.: 150 kHz
Cantilever 3:
Length: 210 µm
Force const.: 2.7 N/m
Res. freq.: 80 kHz
Cantilever 4:
Length: 500 µm
Force const.: 0.2 N/m
Res. freq.: 15 kHz
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|
B50_FMR
|
Special Nanoindentation AFM probe
|
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Sphere, Standard, Rotated, EBD
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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|
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B2_FMR
|
Special Nanoindentation AFM probe
|
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Sphere, Standard, Rotated, EBD
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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|
|
B1_FMR
|
Special Nanoindentation AFM probe
|
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Sphere, Standard, Rotated, EBD
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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|
|
B150_FMR
|
Special Nanoindentation AFM probe
|
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Rotated, EBD, Sphere, Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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|
|
B100_FMR
|
Special Nanoindentation AFM probe
|
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Sphere, Standard, Rotated, EBD
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
|
|
|
Tipless-All-In-One
|
Tipless AFM probe with 4 different cantilevers for various applications
|
- Coating:
None
- Tip Shape:
Tipless
- Cantilevers:
Cantilever 1:
Length: 100 µm
Force const.: 40 N/m
Res. freq.: 350 kHz
Cantilever 2:
Length: 150 µm
Force const.: 7.4 N/m
Res. freq.: 150 kHz
Cantilever 3:
Length: 210 µm
Force const.: 2.7 N/m
Res. freq.: 80 kHz
Cantilever 4:
Length: 500 µm
Force const.: 0.2 N/m
Res. freq.: 15 kHz
|
|
PL2-FMR
|
Force Modulation AFM Probe with Plateau Tip
|
- Coating:
Reflex Aluminium
- Tip Shape:
Plateau
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
|
|
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PL2-FM
|
Force Modulation AFM Probe with Plateau Tip
|
- Coating:
None
- Tip Shape:
Plateau
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
|
|
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