| type |
manufacturer |
short description |
short specs: |
tip shape |
|
 |
High-Aspect-Ratio, Tapping Mode AFM Probe |
coating:None AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
|
High-Aspect-Ratio |
|
 |
High-Aspect-Ratio, Tapping Mode AFM Probe |
coating:Reflex Aluminum AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
|
High-Aspect-Ratio |
|
 |
High-Aspect-Ratio, Tapping Mode AFM Probe |
coating:Reflex Aluminum AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 320 kHz
|
High-Aspect-Ratio |
|
 |
High-Aspect-Ratio, Tapping Mode AFM Probe |
coating:Reflex Aluminum AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 320 kHz
|
High-Aspect-Ratio |
|
 |
High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever |
coating:None AFM cantilever: length: 225 µm force const.: 48 N/m res. freq.: 190 kHz
|
High-Aspect-Ratio |
|
 |
High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever |
coating:Reflex Aluminum AFM cantilever: length: 225 µm force const.: 48 N/m res. freq.: 190 kHz
|
High-Aspect-Ratio |
|
 |
High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever |
coating:Reflex Aluminum AFM cantilever: length: 225 µm force const.: 48 N/m res. freq.: 190 kHz
|
High-Aspect-Ratio |
|
 |
High-Aspect-Ratio, Tapping Mode AFM Probe |
coating:None AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
|
High-Aspect-Ratio |
|
 |
High-Aspect-Ratio, Tapping Mode AFM Probe |
coating:Reflex Aluminum AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
|
High-Aspect-Ratio |
|
 |
High-Aspect-Ratio, Tapping Mode AFM Probe |
coating:Reflex Aluminum AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 320 kHz
|
High-Aspect-Ratio |
|
 |
High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe |
coating:None AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
|
High-Aspect-Ratio |
|
 |
High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe |
coating:Reflex Aluminum AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
|
High-Aspect-Ratio |
|
 |
High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe |
coating:Reflex Aluminum AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
|
High-Aspect-Ratio |
|
 |
High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe |
coating:None AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
|
High-Aspect-Ratio |
|
 |
High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe |
coating:Reflex Aluminum AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 330 kHz
|
High-Aspect-Ratio |