Lateral Force Microscopy AFM Probes (LFM): AFM Tips - NanoAndMore USA

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AFM probes

Lateral Force Microscopy AFM Probes (LFM)

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Standard Lateral Force Mode AFM Probes

Coating:
Reflex Aluminium
Tip Shape:
Standard
Cantilever:
Length: 225 µm
Force const.: 0.2 N/m
Res. freq.: 23 kHz

Contact Mode AFM Probe with Short Cantilever

Coating:
None
Tip Shape:
Standard
Cantilever:
Length: 225 µm
Force const.: 0.2 N/m
Res. freq.: 23 kHz

Contact Mode AFM Probe with Short Cantilever

Coating:
Reflex Aluminium
Tip Shape:
Standard
Cantilever:
Length: 225 µm
Force const.: 0.2 N/m
Res. freq.: 23 kHz

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