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PL2-NCH
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Tapping Mode AFM Probe with Plateau Tip
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- Coating:
None
- Tip Shape:
Plateau
- Cantilever:
Length: 125 µm Force const.: 42 N/m Res. freq.: 330 kHz
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PL2-NCHR
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Tapping Mode AFM Probe with Plateau Tip
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- Coating:
Reflex Aluminium
- Tip Shape:
Plateau
- Cantilever:
Length: 125 µm Force const.: 42 N/m Res. freq.: 330 kHz
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PL2-NCLR
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Tapping Mode AFM Probe with Long Cantilever and Plateau Tip
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- Coating:
None
- Tip Shape:
Plateau
- Cantilever:
Length: 225 µm Force const.: 48 N/m Res. freq.: 190 kHz
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PL2-NCL
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Tapping Mode AFM Probe with Long Cantilever and Plateau Tip
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- Coating:
None
- Tip Shape:
Plateau
- Cantilever:
Length: 225 µm Force const.: 48 N/m Res. freq.: 190 kHz
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PL2-CONT
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Contact Mode AFM Probe with Plateau Tip
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- Coating:
None
- Tip Shape:
Plateau
- Cantilever:
Length: 450 µm Force const.: 0.2 N/m Res. freq.: 13 kHz
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PL2-CONTR
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Contact Mode AFM Probe with Plateau Tip
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- Coating:
Reflex Aluminium
- Tip Shape:
Plateau
- Cantilever:
Length: 450 µm Force const.: 0.2 N/m Res. freq.: 13 kHz
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