CNT-FM
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Single/double wall Carbon Nanotube Probe for high resolution imaging in non-contact-/tapping mode (soft tapping)
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- Coating:
None
- Tip Shape:
Supersharp, CNT
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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CNT-NCH
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Single/double wall Carbon Nanotube Probe for high resolution imaging in non-contact-/tapping mode
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- Coating:
None
- Tip Shape:
CNT, Supersharp
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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SSS-NCH
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SuperSharp, Tapping Mode AFM Probe
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- Coating:
None
- Tip Shape:
Supersharp
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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SSS-NCHR
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SuperSharp, Tapping Mode AFM Probe |
- Coating:
Reflex Aluminium
- Tip Shape:
Supersharp
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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MSS_FMR_13
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SuperSharp, Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Supersharp
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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MSS_FMR_3
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Standard Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Supersharp
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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SSE_NCHR_13
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SuperSharp, Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
Supersharp, EBD
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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SSE_FMR_13
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SuperSharp, Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
Supersharp, EBD
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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SSS-NCL
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SuperSharp, Tapping Mode AFM Probe with Long Cantilever
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- Coating:
None
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
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SSS-NCLR
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SuperSharp, Tapping Mode AFM Probe with Long Cantilever
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- Coating:
Reflex Aluminium
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
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NW-SSS-NCH
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SuperSharp, Tapping Mode AFM Probe |
- Coating:
None
- Tip Shape:
Supersharp
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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TESP-SS
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SuperSharp, Tapping Mode AFM Probe |
- Coating:
None
- Tip Shape:
Supersharp
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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NW-SSS-NCL
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SuperSharp, Tapping Mode AFM Probe with Long Cantilever
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- Coating:
None
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
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SSS-FM
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SuperSharp, Force Modulation AFM Probe |
- Coating:
None
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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SSS-FMR
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SuperSharp, Force Modulation AFM Probe |
- Coating:
Reflex Aluminium
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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biotool_PNP-TR_10
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Soft Contact AFM Probe for Biological Applications
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
High-Aspect-Ratio, Cone Shaped, Supersharp, EBD
- Cantilever:
Length: 100 µm
Force const.: 0.32 N/m
Res. freq.: 67 kHz
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MSS_NCHR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Supersharp, EBD
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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MSS_NCHR_13
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Supersharp, High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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SSS-SEIH
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SuperSharp, Special Tapping Mode AFM Probe
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- Coating:
None
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 15 N/m
Res. freq.: 130 kHz
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NW-SSS-SEIH
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SuperSharp, Special Tapping Mode AFM Probe |
- Coating:
None
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 15 N/m
Res. freq.: 130 kHz
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SSS-SEIHR
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SuperSharp, Special Tapping Mode AFM Probe
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- Coating:
Reflex Aluminium
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 15 N/m
Res. freq.: 130 kHz
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CNT100_ArrowNCR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Arrow , EBD
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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CNT300_ArrowNCR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Arrow , EBD
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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CNT500_ArrowNCR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Arrow , EBD
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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SHR150
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High resolution, Soft Tapping Mode AFM probe.
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- Coating:
Gold Overall
- Tip Shape:
Rotated, Supersharp, Custom
- Cantilever:
Length: 124 µm
Force const.: 5 N/m
Res. freq.: 150 kHz
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AFM Probes
