Supersharp-AFM-Probes

AFM probes, tips, cantilevers

» Enhanced Resolution Imaging AFM Tips (Super Sharp Silicon, SSS Tips):

type	short description	short specs:	tip shape
SSS-NCH	SuperSharp, Tapping Mode AFM Probe	coating:None AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 330 kHz	Supersharp
SSS-NCHR	SuperSharp, Tapping Mode AFM Probe	coating:Reflex Aluminum AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 330 kHz	Supersharp
SSS-NCL	SuperSharp, Tapping Mode AFM Probe with Long Cantilever	coating:None AFM cantilever: length: 225 µm force const.: 48 N/m res. freq.: 190 kHz	Supersharp
SSS-NCLR	SuperSharp, Tapping Mode AFM Probe with Long Cantilever	coating:Reflex Aluminum AFM cantilever: length: 225 µm force const.: 48 N/m res. freq.: 190 kHz	Supersharp
NW-SSS-NCH	SuperSharp, Tapping Mode AFM Probe	coating:None AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 330 kHz	Supersharp
TESP-SS	SuperSharp, Tapping Mode AFM Probe	coating:None AFM cantilever: length: 125 µm force const.: 42 N/m res. freq.: 320 kHz	Supersharp
NW-SSS-NCL	SuperSharp, Tapping Mode AFM Probe with Long Cantilever	coating:None AFM cantilever: length: 225 µm force const.: 48 N/m res. freq.: 190 kHz	Supersharp
SSS-FM	SuperSharp, Force Modulation AFM Probe	coating:None AFM cantilever: length: 225 µm force const.: 2.8 N/m res. freq.: 75 kHz	Supersharp
SSS-FMR	SuperSharp, Force Modulation AFM Probe	coating:Reflex Aluminum AFM cantilever: length: 225 µm force const.: 2.8 N/m res. freq.: 75 kHz	Supersharp
SSS-SEIH	SuperSharp, Special Tapping Mode AFM Probe	coating:None AFM cantilever: length: 225 µm force const.: 15 N/m res. freq.: 130 kHz	Supersharp
NW-SSS-SEIH	SuperSharp, Special Tapping Mode AFM Probe	coating:None AFM cantilever: length: 225 µm force const.: 15 N/m res. freq.: 130 kHz	Supersharp
SSS-SEIHR	SuperSharp, Special Tapping Mode AFM Probe	coating:Reflex Aluminum AFM cantilever: length: 225 µm force const.: 15 N/m res. freq.: 130 kHz	Supersharp