PPP-NCH
|
Standard Tapping Mode AFM Probe |
- Coating:
None
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
|
PPP-NCHR
|
Standard Tapping Mode AFM Probe |
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
NCH
|
Standard Tapping Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
|
|
|
NCHR
|
Standard Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
|
|
|
TESP
|
Standard Tapping Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
|
|
Tap300
|
Standard Tapping Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Rotated
- Cantilever:
Length: 125 µm
Force const.: 40 N/m
Res. freq.: 300 kHz
|
|
|
Tap300Al-G
|
Standard Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminium
- Tip Shape:
Rotated
- Cantilever:
Length: 125 µm
Force const.: 40 N/m
Res. freq.: 300 kHz
|
|
All-In-One-Al
|
AFM probe with 4 different cantilevers for various applications
|
- Coating:
Reflex Aluminium
- Tip Shape:
Rotated
- Cantilevers:
Cantilever 1:
Length: 0
Force const.: 0
Res. freq.: 0
Cantilever 2:
Length: 100 µm
Force const.: 40 N/m
Res. freq.: 350 kHz
Cantilever 3:
Length: 150 µm
Force const.: 7.4 N/m
Res. freq.: 150 kHz
Cantilever 4:
Length: 210 µm
Force const.: 2.7 N/m
Res. freq.: 80 kHz
Cantilever 5:
Length: 500 µm
Force const.: 0.2 N/m
Res. freq.: 15 kHz
|
|
|
TESPA
|
Standard Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
|
|
|
PPP-NCL
|
Tapping Mode AFM Probe, Long Cantilever
|
- Coating:
None
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
|
|
|
PPP-NCLR
|
Tapping Mode AFM Probe, Long Cantilever
|
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
|
|
|
NCL
|
Tapping Mode AFM Probe, Long Cantilever
|
- Coating:
None
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
|
|
|
NCLR
|
Tapping Mode AFM Probe, Long Cantilever
|
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
|
|
|
LTESP
|
Tapping Mode AFM Probe, Long Cantilever
|
- Coating:
None
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
|
|
|
Tap190-G
|
Tapping Mode AFM Probe, Long Cantilever
|
- Coating:
None
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
|
|
|
Tap190Al-G
|
Tapping Mode AFM Probe, Long Cantilever
|
- Coating:
Reflex Aluminium
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
|
|
|
PPP-NCST
|
Soft Tapping Mode AFM Probe |
- Coating:
None
- Tip Shape:
Standard
- Cantilever:
Length: 150 µm
Force const.: 7.4 N/m
Res. freq.: 160 kHz
|
|
|
PPP-NCSTR
|
Soft Tapping Mode AFM Probe |
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 150 µm
Force const.: 7.4 N/m
Res. freq.: 160 kHz
|
|
|
NCST
|
Soft Tapping Mode AFM Probe |
- Coating:
None
- Tip Shape:
Standard
- Cantilever:
Length: 150 µm
Force const.: 7.4 N/m
Res. freq.: 160 kHz
|
|
|
NCSTR
|
Soft Tapping Mode AFM Probe |
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 150 µm
Force const.: 7.4 N/m
Res. freq.: 160 kHz
|
|
|
Tap150-G
|
Soft Tapping Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Rotated
- Cantilever:
Length: 125 µm
Force const.: 5 N/m
Res. freq.: 150 kHz
|
|
|
Tap150Al-G
|
Soft Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminium
- Tip Shape:
Rotated
- Cantilever:
Length: 125 µm
Force const.: 5 N/m
Res. freq.: 150 kHz
|
|
ATEC-NC
|
Tapping Mode AFM Probe with REAL Tip Visibility |
- Coating:
None
- Tip Shape:
Visible
- Cantilever:
Length: 160 µm
Force const.: 45 N/m
Res. freq.: 335 kHz
|
|
ARROW-NC
|
Tapping Mode AFM Probe with Tip at the Very End of the Cantilever |
- Coating:
None
- Tip Shape:
Arrow
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
|
|
|
ARROW-NCR
|
Tapping Mode AFM Probe with Tip at the Very End of the Cantilever |
- Coating:
Reflex Aluminium
- Tip Shape:
Arrow
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
|
|
|
ARROW-UHF
|
Ultra High Frequency AFM Probe with Tip at the Very End of the Cantilever |
- Coating:
Reflex Aluminium
- Tip Shape:
Arrow
- Cantilever:
Length: 35 µm
Force const.: 0
Res. freq.: 2 MHz
|
|
NW-SSS-NCH
|
SuperSharp, Tapping Mode AFM Probe |
- Coating:
None
- Tip Shape:
Supersharp
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
|
|
SSS-NCHR
|
SuperSharp, Tapping Mode AFM Probe |
- Coating:
Reflex Aluminium
- Tip Shape:
Supersharp
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
|
SSS-NCLR
|
SuperSharp, Tapping Mode AFM Probe with Long Cantilever
|
- Coating:
Reflex Aluminium
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
|
|
|
TESP-SS
|
SuperSharp, Tapping Mode AFM Probe |
- Coating:
None
- Tip Shape:
Supersharp
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
|
|
|
PPP-XYNCHR
|
Tapping Mode AFM Probe with Special Alignment System |
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
|
PPP-XYNCSTR
|
Soft Tapping Mode AFM Probe with Special Alignment System |
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 150 µm
Force const.: 7.4 N/m
Res. freq.: 160 kHz
|
|
|
PPP-QNCHR
|
Tapping Mode AFM Probe, for UHV Conditions |
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
|
PPP-NCHAuD
|
Gold Coated Tapping Mode AFM Probe |
- Coating:
Reflex Gold
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
|
PPP-NCLAuD
|
Gold Coated Tapping Mode AFM Probe with Long Cantilever |
- Coating:
Reflex Gold
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
|
|
|
PPP-NCSTAuD
|
Gold Coated Soft Tapping Mode AFM Probe |
- Coating:
Reflex Gold
- Tip Shape:
Standard
- Cantilever:
Length: 150 µm
Force const.: 7.4 N/m
Res. freq.: 160 kHz
|
|
Tap300GD
|
Gold Coated Tapping Mode AFM Probe |
- Coating:
Reflex Gold
- Tip Shape:
Rotated
- Cantilever:
Length: 125 µm
Force const.: 40 N/m
Res. freq.: 300 kHz
|
|
|
PPP-SEIH
|
Special Tapping Mode AFM Probe |
- Coating:
None
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 15 N/m
Res. freq.: 130 kHz
|
|
|
PPP-SEIHR
|
Special Tapping Mode AFM Probe |
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 15 N/m
Res. freq.: 130 kHz
|
|
|
SEIHR
|
Special Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 15 N/m
Res. freq.: 130 kHz
|
|
|
NW-SSS-SEIH
|
SuperSharp, Special Tapping Mode AFM Probe |
- Coating:
None
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 15 N/m
Res. freq.: 130 kHz
|
|
|
SSS-SEIHR
|
SuperSharp, Special Tapping Mode AFM Probe
|
- Coating:
Reflex Aluminium
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 15 N/m
Res. freq.: 130 kHz
|
|
|
PPP-ZEIHR
|
Special Tapping Mode AFM Probe |
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 27 N/m
Res. freq.: 130 kHz
|
|
|
ZEIHR
|
Special Tapping Mode AFM Probe |
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 225 mm
Force const.: 27 N/m
Res. freq.: 130 kHz
|
|
PPP-RT-NCHR
|
Standard Tapping Mode AFM Probe |
- Coating:
Reflex Aluminium
- Tip Shape:
Rotated
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
|
PPP-NCVH
|
Tapping Mode AFM Probe with a High Mechanical Q-Factor |
- Coating:
None
- Tip Shape:
Standard
- Cantilever:
Length: 50 µm
Force const.: 140 N/m
Res. freq.: 1100 kHz
|
|
B2_NCHR
|
Special Nanoindentation AFM probe |
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Sphere, Standard, Rotated
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
CP-NCH-Au
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
Gold
- Tip Shape:
Sphere
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
|
CP-NCH-BSG
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
|
CP-NCH-PM
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
|
CP-NCH-PS
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
|
CP-NCH-SiO
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
BudgetComboBox
|
Mixed Box with 50 BudgetSensors AFM probes of your choice
|
|
|
|
All-In-One
|
AFM probe with 4 different cantilevers for various applications
|
- Coating:
None
- Tip Shape:
Rotated
- Cantilevers:
Cantilever 1:
Length: 100 µm
Force const.: 40 N/m
Res. freq.: 350 kHz
Cantilever 2:
Length: 150 µm
Force const.: 7.4 N/m
Res. freq.: 150 kHz
Cantilever 3:
Length: 210 µm
Force const.: 2.7 N/m
Res. freq.: 80 kHz
Cantilever 4:
Length: 500 µm
Force const.: 0.2 N/m
Res. freq.: 15 kHz
|
|
SSE_NCHR_13
|
SuperSharp, Special Tapping Mode AFM Probe
|
- Coating:
Diamond
- Tip Shape:
Supersharp, EBD
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
|
|
SSE_FMR_13
|
SuperSharp, Special Tapping Mode AFM Probe
|
- Coating:
Diamond
- Tip Shape:
Supersharp, EBD
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
|
|
MSS_NCHR_3
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Supersharp, EBD
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
|
|
M1_NCH_13
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
High-Aspect-Ratio, EBD
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
|
|
EBD2-100_NCH_3
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
|
|
|
EBD2-100_NCH_13
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
|
|
|
EBD2-100_NCHR_3
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
|
|
CNT500_ArrowNCR_3
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Arrow , EBD
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
|
|
CNT300_ArrowNCR_3
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Arrow , EBD
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
|
|
|
CNT100_ArrowNCR_3
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Arrow , EBD
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
|
|
CDR70-EBD
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Arrow , Cylindrical, EBD
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
|
|
|
CDR50-EBD
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Arrow , Cylindrical, EBD
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
|
|
|
CDR130-EBD
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Arrow , Cylindrical, EBD
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
|
|
|
B50_NCHR
|
Special Nanoindentation AFM probe
|
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Sphere, Standard, Rotated
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
|
B1_NCHR
|
Special Nanoindentation AFM probe
|
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Sphere, Standard, Rotated
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
|
B150_NCHR
|
Special Nanoindentation AFM probe
|
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
Standard, Rotated, EBD, Sphere
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
|
B100_NCHR
|
Special Nanoindentation AFM probe
|
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Sphere, Standard, Rotated
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
MC90-70_ArrowNCR_3
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Cylindrical, Arrow , High-Aspect-Ratio
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
|
|
|
MSS_FMR_3
|
Standard Tapping Mode AFM Probe
|
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Supersharp
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
|
|
|
MSS_FMR_13
|
SuperSharp, Special Tapping Mode AFM Probe
|
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Supersharp
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
|
|
|
MSS_NCHR_13
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Supersharp, High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
|
|
M1-ESD_NCH_13
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
|
- Coating:
Aluminium
- Tip Shape:
Cone Shaped
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
|
|
|
NW-SSS-NCL
|
SuperSharp, Tapping Mode AFM Probe with Long Cantilever
|
- Coating:
None
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
|
|
|
SSS-SEIH
|
SuperSharp, Special Tapping Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 15 N/m
Res. freq.: 130 kHz
|
|
|
SSS-NCL
|
SuperSharp, Tapping Mode AFM Probe with Long Cantilever
|
- Coating:
None
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
|
|
|
SSS-NCH
|
SuperSharp, Tapping Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Supersharp
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
SHR150
|
High resolution, Soft Tapping Mode AFM probe.
|
- Coating:
Gold Overall
- Tip Shape:
Rotated, Supersharp, Custom
- Cantilever:
Length: 124 µm
Force const.: 5 N/m
Res. freq.: 150 kHz
|
|
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