AFM Probe Info » AFM Tips: AFM Tip Classification

AFM Tips by Shape

AFM Tips by Shape (macroscopic part, overall shape)

4-sided Pyramidal AFM Tips

PointProbe ® AFM Tip
PointProbe® AFM Tip

AFM tips with a polygon based pyramid shape positioned close to the free end of the AFM cantilever.

  • Macroscopic half-cone angle 20° to 25° viewed along the cantilever axis, 25° to 30° viewed from the side
  • Half-cone angle smaller than 10° at the apex
  • AFM tip height 10-15 µm
  • Front and back pyramid angles of the AFM tip with respect to the vertical differ when the probe is mounted onto the AFM head
» Browse all AFM probes with standard non-rotated AFM tips
SSS-NCLR

SSS-NCLR

SuperSharp, Tapping Mode AFM Probe with Long Cantilever
Coating: Reflex Aluminum
Tip shape: Supersharp
Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
PointProbe ® AFM Tip
PointProbe® AFM Tip

AFM tips with a polygon based pyramid shape positioned close to the free end of the AFM cantilever.

  • Macroscopic half-cone angle 20° to 25° viewed along the cantilever axis, 25° to 30° viewed from the side
  • Half-cone angle smaller than 10° at the apex
  • AFM tip height 10-15 µm
  • Front and back pyramid angles of the AFM tip with respect to the vertical differ when the probe is mounted onto the AFM head
» Browse all AFM probes with standard non-rotated AFM tips
HQ:NSC15/No Al

HQ:NSC15/No Al

Standard Tapping Mode AFM Probe
Coating: None
Tip shape: Rotated
Cantilever:
F 325 kHz
C 40 N/m
L 125 µm

3-sided Pyramidal AFM Tips

Arrow™ AFM Tip
Arrow™ AFM Tip

Tetrahedral pyramid AFM tips at the end of the cantilever for easy positioning in the area of interest.

  • Front and back pyramid angles of the AFM tip with respect to the vertical are equal when the probe is mounted onto the AFM head
  • AFM tip height 10-15 µm
  • AFM tip radius of curvature below 10 nm
» Browse all AFM probes with AFM tips positionned at the very end of the cantilever
ARROW-CONTPt

ARROW-CONTPt

Electrical, Contact Mode AFM Probe with Tip at the Very End of the Cantilever
Coating: Electrically Conductive
Tip shape: Arrow
Cantilever:
F 14 kHz
C 0.2 N/m
L 450 µm
Advanced TEC™ AFM Tip
Advanced TEC™ AFM Tip

Tetrahedral pyramid AFM tips protruding from the end of the cantilever.

  • Real tip visibility allowing the most accurate positioning
  • AFM tip height 15-20 µm
  • AFM tip radius of curvature below 10 nm
» Browse all AFM probes with AFM tips protruding over the very end of the cantilever
ATEC-EFM

ATEC-EFM

Electrical, Force Modulation AFM Probe with REAL Tip Visibility
Coating: Electrically Conductive
Tip shape: Visible
Cantilever:
F 85 kHz
C 2.8 N/m
L 240 µm
Arrow™ AFM Tip
OPUS™ AFM Tip

Tetrahedral pyramid AFM tips with a leading pyramid edge at right angle to the cantilever axis for optimized positioning upon the test sample.

  • AFM tip height ~ 14 µm
  • AFM tip radius of curvature of uncoated tips < 7 nm
» Browse all AFM probes with OPUS AFM tips
200AC-NA

200AC-NA

Soft Tapping Mode AFM Probe with Tip at the Very End of the Cantilever
Coating: Reflex Aluminum
Tip shape: OPUS
Cantilever:
F 135 kHz
C 9 N/m
L 200 µm

4-sided Casted (Hollow) Pyramidal AFM Tips

Silicon Nitride AFM Tip
Silicon Nitride
AFM Tip

AFM tips with a rectangular-based pyramid.

  • When mounted onto the AFM head, only the front AFM tip interacts with the sample surface
  • Overall AFM tip height 12 μm
  • Effective AFM tip height above 800 nm
  • Double tip spacing 4.5 μm
» Browse all AFM probes with rectangular-based pyramidal AFM tips
Q-SiNi

Q-SiNi

Premounted Silicon Nitride AFM Probe, for Quesant/Ambios AFM systems

Coating: Reflex Gold
Tip shape: Pyramid
This probe features 2 cantilevers
F 30 kHz
C 0.27 N/m
L 100 µm
F 10 kHz
C 0.06 N/m
L 200 µm

AFM Tips by Shape (active part of the tip, involved in measurement)

3-sided Sharpened Pyramidal AFM Tip
3-sided Sharpened
Pyramidal AFM Tip

AFM tips with a 3-sided sharpened pyramid positioned close to the free end of the AFM cantilever.

» Browse all AFM probes with 3-sided sharpened pyramidal AFM tips
LTESP

LTESP

Tapping Mode AFM Probe, Long Cantilever

Coating: None
Tip shape: Standard
Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
SuperSharpSilicon™ AFM Tip
SuperSharpSilicon™ AFM Tip

AFM tips with a SuperSharpSilicon apex for high resolution AFM imaging of nanostructures and microroughness.

  • Guaranteed AFM tip radius of curvature below 5 nm
  • Typical AFM tip radius of curvature 2 nm
  • Typical aspect ratio of the last 200 nm 4:1
  • Half cone angle 200 nm from the AFM tip apex below 10°
» Browse all AFM probes with super sharpened pyramidal AFM tips
SSS-NCH

SSS-NCH

SuperSharp, Tapping Mode AFM Probe
Coating: None
Tip shape: Supersharp
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm

High Aspect Ratio Spike AFM Tips

High Aspect Ratio AFM Tip
High Aspect Ratio AFM Tip

AFM tips with a high aspect ratio portion allowing measurements of deep trenches.

  • High aspect portion of the AFM tip larger than 2 µm and symmetric when viewed from side as well as along cantilever axis
  • Typical aspect ratio for the last 2 µm of the AFM tip in the order of 7:1 to 12:1
  • Half cone angle of the high aspect ratio portion of the AFM tip typically from 5° down to below 2.8°
» Browse all AFM probes with focused ion beam AFM tips
AR5-NCL

AR5-NCL

High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever
Coating: None
Tip shape: High-Aspect-Ratio
Cantilever:
F 190 kHz
C 48 N/m
L 225 µm

AFM tips with a high aspect ration portion allowing measurements of deep trenches. The tilted high aspect ratio portion compensates the mounting angle within the AFM head. (for AFM instruments with a mounting angle of 13°)

  • Tilted high aspect ratio tip compensates the mounting angle of AFM head
  • Sidewall angles and sidewalls are „not“ distorted
Regular High Aspect Ratio AFM Tip
Regular High Aspect Ratio 
AFM Tip
Tilt Compensated High Aspect Ratio AFM Tip
Tilt Compensated 
High Aspect Ratio AFM Tip
Tilt Compensated High Aspect Ratio AFM Tip
Tilt Compensated 
High Aspect Ratio AFM Tip

» Browse all AFM probes with tilt compensated high aspect ratio AFM tips

 
 
AR10T-NCHR

AR10T-NCHR

High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe
Coating: Reflex Aluminum
Tip shape: High-Aspect-Ratio
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
EBD AFM Tip
EBD AFM Tip

AFM tips with Electron Beam Deposited (EBD) extratips.

  • Extratips with various geometry on the apex of the silicon AFM tip for different applications
  • Sharp EBD AFM tips for high resolution imaging and high aspect ratio EBD AFM tips for deep trench measurements
» Browse all AFM probes with EBD AFM tips
M1-HAR

M1-HAR

High-aspect ratio, tilt compensated EBD AFM whisker for automated non-contact AFM
Coating: None
Tip shape: High-Aspect-Ratio, Cone Shaped, EBD
Cantilever:
F 320 kHz
C 40 N/m
L 120 µm
Plateau AFM Tip
Plateau AFM Tip

AFM tips with a plateau instead of a sharp tip.

  • Plateau formed by Focused Ion Beam (FIB) milling out of a symmetrically etched tip building a rod on top of a conical tip
  • Plateau diameter typically equals 1.8 µm
» Browse all AFM probes with plateau AFM tips
PL2-NCH

PL2-NCH

Tapping Mode AFM Probe with Plateau Tip
Coating: None
Tip shape: Plateau
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
Rounded AFM Tip
Rounded AFM Tip

AFM tips with an intentionally increased and well-defined radius of curvature.

  • AFM tip radius of curvature: 90 nm from the front, 160 nm from the side
» NANOSENSORS Special developments
Special Developments

Special Developments

Not available in the standard scope of products

Coating: various
Tip shape: various
Cantilever:
Cantilever: various
Sphere AFM Tip
Sphere AFM Tip

AFM tips with a sphere of well defined size at the end of the AFM tip pyramid or at the end of a tipless AFM cantilever.

  • For applications that require hard contact between tip and sample this AFM tip offers a hemispherical, symmetric and extremely smooth hard tipside coating
  • Different sphere radii available
» Browse all AFM probes with sphere AFM tips
B300_NCHR

B300_NCHR

Special EBD nanoindentation AFM probe
Coating: Reflex Aluminum
Tip shape: Sphere, EBD
Cantilever:
F 330 kHz
C 40 N/m
L 125 µm

AFM Tips by Material

Silicon AFM Tip
Silicon AFM Tip

AFM tips made of single crystal silicon.

  • All components of the AFM probe: the AFM tip, the AFM cantilever and the AFM support chip are made of monolithic single crystal silicon
  • Silicon is highly doped for static charge dissipation
» Browse all AFM probes with silicon AFM tips
Q-Cond-E

Q-Cond-E

Premounted Electrical, Contact Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Electrically Conductive
Tip shape: Rotated
Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
sSilicon Nitride AFM Tip
Silicon Nitride AFM Tip

AFM tips made of silicon nitride.

  • The AFM tip and the AFM cantilever are made of silicon nitride
  • The AFM cantilever is attached to a silicon or a borosilicate glass support chip
» Browse all AFM probes with silicon nitride AFM tips
Q-SiNi

Q-SiNi

Premounted Silicon Nitride AFM Probe, for Quesant/Ambios AFM systems

Coating: Reflex Gold
Tip shape: Pyramid
This probe features 2 cantilevers
F 30 kHz
C 0.27 N/m
L 100 µm
F 10 kHz
C 0.06 N/m
L 200 µm

AFM Tips by Coating

Gold Coated AFM Tip
Gold Coated AFM Tip

AFM tips with a gold coating.

  • Gold coating covers the entire cantilever as well
  • Electrically conductive
  • Basis for tip functionalization
  • Bio-compatible
» Browse all AFM probes with gold coated AFM tips
240AC-GG

240AC-GG

Gold Coated Force Modulation AFM Probe with Tip at the Very End of the Cantilever
Coating: Gold Overall
Tip shape: OPUS
Cantilever:
F 70 kHz
C 2 N/m
L 240 µm
Platinum Coated AFM Tip
Platinum Coated AFM Tip

AFM tips with a platinum or a chromium/platinum coating.

  • Platinium coating covers the entire cantilever as well
  • Electrically conductive
  • Used for electric mode AFM measurements
» Browse all AFM probes with platinium coated AFM tips
ElectriTap300-G

ElectriTap300-G

Electrical, Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip shape: Rotated
Cantilever:
F 300 kHz
C 40 N/m
L 125 µm
Platinum/Iridium Coated AFM Tip
Platinum/Iridium Coated
AFM Tip

AFM tips with a platinum/iridium coating.

  • Platinium/Iridium coating covers the entire cantilever as well
  • Electrically conductive
  • Used for electric mode AFM measurements
» Browse all AFM probes with platinum/iridium coated AFM tips
CONTPt

CONTPt

Electrical, Contact Mode AFM Probe
Coating: Electrically Conductive
Tip shape: Standard
Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
DLC Coated AFM tip
DLC Coated AFM Tip

AFM tips with a hard wear resistant Diamond Like Carbon (DLC) coating.

  • DLC coating covers the tip side of the cantilever as well
  • Used in applications where increased wear resistance is needed
» Browse all AFM probes with diamond-like-carbon (DLC) coated AFM Tips
HQ:NSC15/Hard/Al BS

HQ:NSC15/Hard/Al BS

Long Scanning, DLC Hardened Tapping Mode AFM Probe
Coating: Hard Diamond-Like-Carbon
Tip shape: Rotated
Cantilever:
F 325 kHz
C 40 N/m
L 125 µm
Diamond Coated AFM Tip
Diamond Coated AFM Tip

AFM tips with a real diamond coating for unsurpassed wear resistance.

  • Diamond coating covers the tip side of the cantilever as well
  • Ensures an even higher durability than DLC coating
» Browse all AFM probes with real diamond coated AFM tips
NW-DT-FMR

NW-DT-FMR

Diamond Coated Force Modulation AFM Probe
Coating: Diamond
Tip shape: Standard
Cantilever:
F 105 kHz
C 6.2 N/m
L 225 µm
Conductive Diamond Coated AFM Tip
Conductive Diamond
Coated AFM Tip

AFM tips with a doped diamond coating.

  • Conductive Diamond coating covers the tip side of the cantilever as well
  • Provides high wear resistance for electric mode applications
» Browse all AFM probes with conductive diamond coated AFM tips
CDT-NCLR

CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever
Coating: Diamond,
Conductive Diamond
Tip shape: Standard
Cantilever:
F 210 kHz
C 72 N/m
L 225 µm
Cobalt Alloy Coated AFM Tip
Cobalt Alloy Coated
AFM Tip

AFM tips with a cobalt alloy magnetic coating for Magnetic Force Microscopy (MFM) measurements.

  • Cobalt Alloy coating covers the tip side of the cantilever as well
  • Several different variations with different magnetic momentum and coercivity available
» Browse all AFM probes with magnetic AFM tips
SC-20-M

SC-20-M

Hard Magnetic, High Momentum AFM Probe
Coating: Magnetic
Tip shape: Pyramid
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
Silicon Nitride Coated AFM Tip
Silicon Nitride Coated
AFM Tip

AFM tips with a thin silicon nitride coating.

  • Silicon Nitride coating covers the entire cantilever as well
  • Improved wear resistance
  • Bio-compatible
» NANOSENSORS Special Developments
Special Developments

Special Developments

Not available in the standard scope of products

Coating: various
Tip shape: various
Cantilever:
Cantilever: various
Silicide Coated AFM Tip
Silicide Coated AFM Tip

AFM tips with a silicide coating.

  • Silicide coating covers the entire cantilever as well
  • Electrically conductive
  • Bio-compatible

» Browse all AFM probes with silicide coated AFM tips

PtSi-FM

PtSi-FM

Electrical, Force Modulation AFM Probes
Coating: Platinum Silicide Overall
Tip shape: Standard
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm