AFM Probe Info » Special AFM probes classification

Electro-Chemical Probe
Electro-Chemical Probe

AFM probe for measuring electro-chemical reactions such as redox reactions, corrosion and dissolution of materials.

Tip: Silicon / SiO2 / Pt / SiN
Cantilevers: Silicon / SiO2 / Pt / SiN
Tip radius of curvature < 40 nm

» Electro-chemical probe
Special Developments

Special Developments

Not available in the standard scope of products

Coating: various
Tip shape: various
Cantilever:
Cantilever: various
Akiyama-Probe
Akiyama-Probe

AFM probe that requires neither an external piezo actuator, nor optical detection.

  • Based on a quartz tuning fork combined with micromachined cantilever
  • Benefits from both the tuning fork's stable oscillation and the silicon cantilever's reasonable spring constant
» Akiyama-Probe
Akiyama-Probe

Akiyama-Probe

Novel self-sensing, self-actuating AFM probe for intermittent contact

Coating: None
Tip shape: Visible
Cantilever:
F 50 kHz
C 5 N/m
L 310 µm
Scanning Thermal Microscopy Cantilever
Scanning Thermal
Microscopy Cantilever

AFM probe showing an AFM cantilever with an integrated resistance thermometer for thermal mapping in contact mode.

  • Tip can be heated to map thermal conductivity on passive samples or biased to measure local hotspots
  • Other applications include applying single point voltages, providing local current stimulus, or detecting thermal properties resulting in cantilever deflections
» Thermal AFM probe
KNT-SThM-1an

KNT-SThM-1an

Scanning thermal microscopy probe
Coating: None
Tip shape: Custom
Cantilever:
F
C 0.25 N/m
L 150 µm
Extra Tall AFM Tip
Extra Tall
PointProbePlus Tip

AFM probes with extra tall tips (>30 microns) for measurements on very rough surfaces and for custom applications.

  • Extra-tall PointProbePlus Tips
  • Extra-tall ATEC Tips
» Extra-tall PointProbePlus and ATEC tips
Special Developments

Special Developments

Not available in the standard scope of products

Coating: various
Tip shape: various
Cantilever:
Cantilever: various
AFM Cantilever for Higher Harmonic Operation
AFM Cantilever for
Higher Harmonic Operation

Bi-modal AFM cantilevers for higher harmonic operation allow collecting information about the mechanical properties of the sample material.

» Bi-modal AFM probes
Special Developments

Special Developments

Not available in the standard scope of products

Coating: various
Tip shape: various
Cantilever:
Cantilever: various