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AFM Calibration Standards
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AFM Calibration Standards
AFM Calibration Standards
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Please find below our calibration standards, listed by manufacturer:
Call us:
+ 49 (0) 6441 870 6272
Wetzlar, Germany
+ 49 (0) 6 441 870 6 272
+ 49 (0) 6 441 870 6 274
info@nanoandmore.com
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NANOSENSORS™
»
Lateral-(xy)-Calibration Standard (2D100)
»
Lateral-(xy)-Calibration Standard (2D200)
»
Lateral-(xy)-Calibration Standard (2D300)
»
Flatness Standard (FLAT)
»
Step Height Standard (H8)
Download Flyer
BudgetSensors®
»
Tipcheck – AFM tip characterization sample
»
Height Calibration Standard HS-20MG
»
Height Calibration Standard HS-100MG
»
Height Calibration Standard HS-500MG
»
XYZ Calibration Nanogrid CS-20NG
TeamNanoTec®
»
ISNE - Probe Tip Characterizer
»
IVPS - Probe Tip Characterizer
»
IFSR - Probe Tip Characterizer
We apply a quality management system in accordance with DIN EN ISO 9001:2008 (Certificate No.: 08301/2)