Akiyama-Probe

AFM probe that requires neither an external piezo actuator, nor optical detection.

• Based on a quartz tuning fork combined with micromachined cantilever
• Benefits from both the tuning fork's stable oscillation and the silicon cantilever's reasonable spring constant

Tipless AFM Probe

AFM probes with one or more cantilevers without an AFM tip.

Electro-Chemical Probe

AFM probe for measuring electro-chemical reactions such as redox reactions, corrosion and dissolution of materials.

Tip: Silicon / SiO_² / Pt / SiN
Cantilevers: Silicon / SiO_² / Pt / SiN
Tip radius of curvature < 40 nm

Scanning Thermal
Microscopy Cantilever

AFM probe showing an AFM cantilever with an integrated resistance thermometer for thermal mapping in contact mode.

• Tip can be heated to map thermal conductivity on passive samples or biased to measure local hotspots
• Other applications include applying single point voltages, providing local current stimulus, or detecting thermal properties resulting in cantilever deflections

Extra Tall
PointProbePlus Tip

AFM probes with extra tall tips (>30 microns) for measurements on very rough surfaces and for custom applications.

• Extra Tall PointProbePlus Tips
• Extra Tall ATEC Tips

Ultra-Short
AFM Cantilever

AFM probes with very short, narrow and thin cantilevers with Electron Beam Deposited AFM tips for High Speed Scanning.

AFM Cantilever for
Higher Harmonic Operation

Bi-modal AFM cantilever for higher harmonic operation.

• Allow collecting information about the mechanical properties of materials