AFM Probes » AR10T-NCHR

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AR10T-NCHR-10 Box of 10 AFM Probes
€1 726.00
AR10T-NCHR-20 Box of 20 AFM Probes
€3 088.00
You save 364.00 EUR or 10.50% with this box
AR10T-NCHR-50 Box of 50 AFM Probes
€6 813.00
You save 1817.00 EUR or 21.10% with this box
AR10T-NCHR-W Box of 370 AFM Probes
€33 150.00
You save 30712.00 EUR or 48.10% with this box
esd kit

ESD Kit recommended with this product. Click here to order: ESD Kit

AR10T-NCHR

High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe

Coating: Reflex Aluminum
Tip shape: High-Aspect-Ratio
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
*nominal values

NANOSENSORS™ AR10T-NCHR AFM tips are designed for non-contact mode or tapping mode AFM. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 10:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.

On the model AR10T the last 1.5 µm of the tip are tilted 13° to the center axis of the cantilever. With this feature the tilt angle of the cantilever caused by the mount of the AFM head (commonly 13°) will be compensated. Now, nearly vertical sidewalls can be measured offering a symmetrical scan.

The probe offers unique features:
  • length of the high aspect ratio portion of the tip > 1.5 µm
  • typical aspect ratio at 1.5 µm in the order of 12:1 (when viewed from side as well as along cantilever axis)
  • high aspect ratio portion of the tip tilted 13° to the cantilever surface normal
  • excellent tip radius of curvature
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 125 µm (115 - 135 µm)*
  • 30 µm (22.5 - 37.5 µm)*
  • 4 µm (3 - 5 µm)*
  • 42 N/m (10 - 130 N/m)*
  • 330 kHz (204 - 497 kHz)*
  • * guaranteed range This product features alignment grooves on the back side of the holder chip.

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