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ARROW-CONT-10 Box of 10 AFM Probes
ARROW-CONT-50 Box of 50 AFM Probes
You save 232.00 EUR or 20.40% with this box
ARROW-CONT-W Box of 385 AFM Probes
€4 630.00
You save 4109.50 EUR or 47.00% with this box
Product availability: On stock


Contact Mode AFM Probe with Tip at the Very End of the Cantilever

Coating: None
Tip shape: Arrow
F 14 kHz
C 0.2 N/m
L 450 µm
*nominal values
Optimized positioning through maximized tip visibility

NanoWorld Arrow CONT probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.

All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip.

Additionally, this probe offers an excellent tip radius of curvature.

The unique Arrowshape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.06 - 0.38 N/m)*
  • 14 kHz (10 - 19 kHz)*
  • 450 µm (445 - 455 µm)*
  • 45 µm (40 - 50 µm)*
  • 2 µm (1.5 - 2.5 µm)*
  • * typical range

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