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ARROW-NC-10 Box of 10 AFM Probes
ARROW-NC-50 Box of 50 AFM Probes
You save 232.00 EUR or 20.40% with this box
ARROW-NC-W Box of 385 AFM Probes
€4 630.00
You save 4109.50 EUR or 47.00% with this box
Product availability: On stock


Tapping Mode AFM Probe with Tip at the Very End of the Cantilever

Coating: None
Tip shape: Arrow
F 285 kHz
C 42 N/m
L 160 µm
*nominal values

Optimized positioning through maximized tip visibility

NanoWorld Arrow™ NC probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip.

Additionally, this probe offers an excellent tip radius of curvature.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.


AFM Tip:

  • AFM Cantilever:

  • Beam
  • 42 N/m (27 - 80 N/m)*
  • 285 kHz (240 - 380 kHz)*
  • 160 µm (155 - 165 µm)*
  • 45 µm (40 - 50 µm)*
  • 4.6 µm (4.1 - 5.1 µm)*
  • * typical range

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