AFM Probes » ATEC-NC

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Order Code Price
Quantity
ATEC-NC-10 Box of 10 AFM Probes
€384.00
ATEC-NC-50 Box of 50 AFM Probes
€1 513.00
You save 407.00 EUR or 21.20% with this box
esd kit

ESD Kit recommended with this product. Click here to order: ESD Kit

ATEC-NC

Tapping Mode AFM Probe with REAL Tip Visibility

Coating: None
Tip shape: Visible
Cantilever:
F 335 kHz
C 45 N/m
L 160 µm
*nominal values

NANOSENSORS™ AdvancedTEC™ NC AFM tips are designed for non-contact or tapping mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever. This unique feature allows precise positioning and makes the AdvancedTEC™  the only AFM scanning probe in the world that offers REAL TIP VISIBILITY FROM TOP, even when the probe is tilted due to its mounting onto the AFM head. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation).

Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.

The probe offers unique features:

  • REAL TIP VISIBILITY FROM TOP
  • excellent tip radius of curvature
  • monolithic silicon
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
Uncoated

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 160 µm (150 - 170 µm)*
  • 45 µm (40 - 50 µm)*
  • 4.6 µm (3.6 - 5.6 µm)*
  • 45 N/m (12 - 110 N/m)*
  • 335 kHz (210 - 490 kHz)*
  • * guaranteed range

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