AFM Probes » CONTR

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Order Code Price
Quantity
CONTR-10 Box of 10 AFM Probes
€285.00
CONTR-20 Box of 20 AFM Probes
€510.00
You save 60.00 EUR or 10.50% with this box
CONTR-50 Box of 50 AFM Probes
€1 125.00
You save 300.00 EUR or 21.10% with this box
CONTR-W Box of 385 AFM Probes
€5 777.00
You save 5195.50 EUR or 47.40% with this box

CONTR

Standard Contact Mode AFM Probe

the industry standard

Coating: Reflex Aluminum
Tip shape: Standard
Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values
NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.
Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 450 µm (445 - 455 µm)*
  • 50 µm (45 - 55 µm)*
  • 2 µm (1.5 - 2.5 µm)*
  • 0.2 N/m (0.07 - 0.4 N/m)*
  • 13 kHz (9 - 17 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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