The new KNT-SThM-2an Scanning Thermal Microscopy probes, based on the existing KNT product KNT-SThM-1an, feature a standard probe base size and a structurally compensated cantilever to give flatter cantilevers and minimise temperature induced cantilever bending. They address a fundamental limitation of soft silicon nitride SThM probes: the thermal bending of the cantilevers when approaching hot surfaces, which ultimately causes the optical feedback to fail. The probes are able to stay in contact with hotter surfaces, expanding the range of measurements and samples that can be employed.
Kelvin Nanotechnology provides batch fabricated thermal probes which provide better than 100 nm resolution for both the topography and thermal images. The cantilever is made of SiN with a thin metal wire deposited such that the highest resistance portion of the wire is near the apex of the tip.