AFM Probes » LTESP

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Order Code Price
Quantity
LTESP-10 Box of 10 AFM Probes
€259.00
LTESP-20 Box of 20 AFM Probes
€463.00
You save 55.00 EUR or 10.60% with this box
LTESP-50 Box of 50 AFM Probes
€1 023.00
You save 272.00 EUR or 21.00% with this box
LTESP-W Box of 385 AFM Probes
€5 252.00
You save 4719.50 EUR or 47.30% with this box

LTESP

Tapping Mode AFM Probe, Long Cantilever

Coating: None
Tip shape: Standard
Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
*nominal values

NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping™ mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.

This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acuired Veeco metrology business, is no longer selling the original probe which has always been manufactured by NanoWorld®.

Uncoated

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 225 µm (220 - 230 µm)*
  • 38 µm (33 - 43 µm)*
  • 7 µm (6.5 - 7.5 µm)*
  • 48 N/m (31 - 71 N/m)*
  • 190 kHz (160 - 210 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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