AFM Probes » M-CIS

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Quantity
NT_MCIS_v0010-5 Box of 5 AFM Probes
€750.00
esd kit

ESD Kit recommended with this product. Click here to order: ESD Kit

M-CIS

EBD AFM whisker for non-contact AFM microlens contact image sensor (CIS) inspection

Coating: Reflex Aluminum
Tip shape: High-Aspect-Ratio, Cone Shaped, EBD
Cantilever:
F 320 kHz
C 40 N/m
L 120 µm
*nominal values
The SEMI standard for microlens contact image sensor (CIS) inspection: diamond-like EBD  whisker with an aspect ratio >5 for non-contact AFM.
Al reflex

Whisker(s):

  • HDC
  • 400 nm (300 - 500 nm)*
  • <4°
  • >5*
  • 10 nm (8 - 12 nm)*
  • 13° (±1°)*
  • * guaranteed

    AFM Tip:

  • AFM Cantilever:

  • Beam
  • 120 µm (115 - 125 µm)**
  • 30 µm (28 - 32 µm)**
  • 4.4 µm (3.9 - 4.9 µm)**
  • 40 N/m (20 - 60 N/m)**
  • 320 kHz (270 - 370 kHz)**
  • ** guaranteed range

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