AFM Probes » NW-SSS-SEIH

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Order Code Price
Quantity
NW-SSS-SEIH-10 Box of 10 AFM Probes
€648.00
NW-SSS-SEIH-20 Box of 20 AFM Probes
€1 160.00
You save 136.00 EUR or 10.50% with this box
NW-SSS-SEIH-50 Box of 50 AFM Probes
€2 558.00
You save 682.00 EUR or 21.00% with this box
esd kit

ESD Kit recommended with this product. Click here to order: ESD Kit

NW-SSS-SEIH

SuperSharp, Special Tapping Mode AFM Probe

Coating: None
Tip shape: Supersharp
Cantilever:
F 130 kHz
C 15 N/m
L 225 µm
*nominal values
NanoWorld Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip. 

Additionally, this probe offers an excellent tip radius of curvature.

Uncoated

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 225 µm (220 - 230 µm)*
  • 33 µm (27.5 - 37.5 µm)*
  • 5 µm (4.5 - 5.5 µm)*
  • 15 N/m (9 - 25 N/m)*
  • 130 kHz (110 - 150 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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