AFM Probes » PL2-CONT

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PL2-CONT-10 Box of 10 AFM Probes
889.00 USD
Product availability: On stock

PL2-CONT

Contact Mode AFM Probe with Plateau Tip

Coating: none
Tip shape: Plateau
Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

Applications

The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.

NANOSENSORS™ PL2-CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request.

The probe offers unique features:

  • plateau diameter of typically 1.8 µm
  • single crystalline silicon
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.02 - 0.77 N/m)*
  • 13 kHz (6 - 21 kHz)*
  • 450 µm (440 - 460 µm)*
  • 50 µm (42 - 57 µm)*
  • 2 µm (1 - 3 µm)*
  • * typical range
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