AFM Probes » PL2-NCHR

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PL2-NCHR-10 Box of 10 AFM Probes
€767.00

PL2-NCHR

Tapping Mode AFM Probe with Plateau Tip

Coating: Reflex Aluminum
Tip shape: Plateau
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
*nominal values

The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.

NANOSENSORS™ PL2-NCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request.

The probe offers unique features:

  • plateau diameter of typically 1.8 µm
  • single crystalline silicon
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of cantilever
  • high mechanical Q-factor for high sensitivity
Aluminium coating on detector side of cantilever

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 125 µm (115 - 135 µm)*
  • 30 µm (22.5 - 37.5 µm)*
  • 4 µm (3 - 5 µm)*
  • 42 N/m (10 - 130 N/m)*
  • 330 kHz (204 - 497 kHz)*
  • * guaranteed range This product features alignment grooves on the back side of the holder chip.

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